DocumentCode
2290277
Title
Growth of III-Nitride quantum structures for device applications
Author
Nikishin, Sergey ; Holtz, Mark
Author_Institution
Nano Tech Center, Texas Tech Univ., Lubbock, TX, USA
fYear
2010
fDate
17-20 Aug. 2010
Firstpage
31
Lastpage
36
Abstract
Using GSMBE with ammonia on (0001) sapphire substrates, AlN/AlGaN nanostructured short period superlattices (SPSLs), with respective well and barrier thickness from 0.5 to 1 nm and from 0.75 to 1.5 nm, have been shown to have energy gaps in the deep UV suitable for light emitting diodes (LEDs) and photodetectors (PDs) operating down to 247 nm. Performance of LEDs and PDs is limited by factors including efficiency of radiative recombination and absorption in the active region and electrical resistivity of p-type wide bandgap SPSLs. Based on MOVPE, we have used selective area epitixy (SAE) to grow InGaN/GaN quantum structures. By patterning SiO2 hard mask materials on planar sapphire substrates, we have grown various shapes including pyramidal stripes with InxGa1-xN multiple quantum wells. The structures at the apex are found to have very high In content with corresponding optical emission in the green wavelength range and excellent uniformity.
Keywords
III-V semiconductors; aluminium compounds; electrical resistivity; energy gap; gallium compounds; light emitting diodes; luminescence; molecular beam epitaxial growth; nanostructured materials; photodetectors; semiconductor growth; semiconductor superlattices; wide band gap semiconductors; AlN-AlGaN; GSMBE; LED; SiO2; device applications; electrical resistivity; energy gap; gas source molecular beam epitaxy; green wavelength range; hard mask materials; light emitting diodes; nanostructured short period superlattices; optical emission; p-type wide bandgap SPSL; photodetectors; pyramidal stripes; quantum structure growth; radiative recombination; selective area epitaxy; size 0.5 nm to 1.5 nm;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
Conference_Location
Seoul
ISSN
1944-9399
Print_ISBN
978-1-4244-7033-4
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2010.5698066
Filename
5698066
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