DocumentCode
2290399
Title
Research on price risk of soybean market based on extreme value theory
Author
Hu, Nai-Peng
Author_Institution
Coll. of Econ. & Manage., Northeast Agric. Univ., Harbin, China
fYear
2009
fDate
14-16 Sept. 2009
Firstpage
824
Lastpage
830
Abstract
This paper introduces the extreme value theory (EVT) of VaR into the research on the price risk of Chinese soybean spot market and American soybean future market. As some improvement, this paper introduces partial regression coefficient, clustering and runs test into the threshold value model. On base of extreme value theory threshold value model can do quantitative management well for extreme price risk of small probability with great loss in different markets. The improvement of traditional threshold model is feasible and can gain ideal result. Based on the empirical results, the difference between two spot markets is discussed. There is similarity of extreme price risk in Chinese spot market and American futures market. The price of American futures market in the past has long influence on that in the future. The market relevance between American markets is stronger than that between Chinese markets. Furthermore, the difference between manufacturer risk and purchasing risk in each market is also discussed.
Keywords
crops; pricing; purchasing; regression analysis; risk management; American soybean future market; Chinese soybean spot market; VaR; extreme value theory threshold value model; manufacturer risk; partial regression coefficient; price risk; purchasing risk; quantitative management; Agricultural engineering; Conference management; Educational institutions; Engineering management; Fluctuations; Manufacturing processes; Reactive power; Resource management; Risk management; Testing; VaR; cluster; extreme value theory; manufacturer risk; purchase risk;
fLanguage
English
Publisher
ieee
Conference_Titel
Management Science and Engineering, 2009. ICMSE 2009. International Conference on
Conference_Location
Moscow
Print_ISBN
978-1-4244-3970-6
Electronic_ISBN
978-1-4244-3971-3
Type
conf
DOI
10.1109/ICMSE.2009.5318231
Filename
5318231
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