• DocumentCode
    2290416
  • Title

    Combining single-event latchup and reliability requirements for space vehicles

  • Author

    Willing, Walter E. ; Goldstein, Norman P.

  • Author_Institution
    Westinghouse Electr. Corp., Baltimore, MD, USA
  • fYear
    1995
  • fDate
    16-19 Jan 1995
  • Firstpage
    445
  • Lastpage
    449
  • Abstract
    In this paper, the authors suggest the consideration of destructive single-event latchup (SEL) as an additional failure mode for components in space systems. With this orientation, the failure rate for this process can be combined with the standard failure analysis to obtain a composite failure rate prediction. This paper shows how SEL can be included in the standard reliability formalism and how this connection can be used to derive realistic specifications for the allowable SEL rate in a given satellite system
  • Keywords
    failure analysis; reliability; reliability theory; space vehicles; composite failure rate prediction; destructive single-event latchup; failure mode; failure rate; reliability; satellite; space systems; space vehicles; specifications; Cosmic rays; Costs; Degradation; Electronic components; Failure analysis; Integrated circuit reliability; Ionizing radiation; Radiation effects; Single event upset; Space vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1995. Proceedings., Annual
  • Conference_Location
    Washington, DC
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-2470-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1995.513282
  • Filename
    513282