DocumentCode
2290416
Title
Combining single-event latchup and reliability requirements for space vehicles
Author
Willing, Walter E. ; Goldstein, Norman P.
Author_Institution
Westinghouse Electr. Corp., Baltimore, MD, USA
fYear
1995
fDate
16-19 Jan 1995
Firstpage
445
Lastpage
449
Abstract
In this paper, the authors suggest the consideration of destructive single-event latchup (SEL) as an additional failure mode for components in space systems. With this orientation, the failure rate for this process can be combined with the standard failure analysis to obtain a composite failure rate prediction. This paper shows how SEL can be included in the standard reliability formalism and how this connection can be used to derive realistic specifications for the allowable SEL rate in a given satellite system
Keywords
failure analysis; reliability; reliability theory; space vehicles; composite failure rate prediction; destructive single-event latchup; failure mode; failure rate; reliability; satellite; space systems; space vehicles; specifications; Cosmic rays; Costs; Degradation; Electronic components; Failure analysis; Integrated circuit reliability; Ionizing radiation; Radiation effects; Single event upset; Space vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1995. Proceedings., Annual
Conference_Location
Washington, DC
ISSN
0149-144X
Print_ISBN
0-7803-2470-6
Type
conf
DOI
10.1109/RAMS.1995.513282
Filename
513282
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