• DocumentCode
    2290515
  • Title

    Label set perturbation for MRF based neuroimaging segmentation

  • Author

    Hower, Dylan ; Singh, Vikas ; Johnson, Sterling C.

  • Author_Institution
    Epic Syst. Inc., Madison, WI, USA
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    849
  • Lastpage
    856
  • Abstract
    Graph-cuts based algorithms are effective for a variety of segmentation tasks in computer vision. Ongoing research is focused toward making the algorithms even more general, as well as to better understand their behavior with respect to issues such as the choice of the weighting function and sensitivity to placement of seeds. In this paper, we investigate in the context of neuroimaging segmentation, the sensitivity/stability of the solution with respect to the input “labels” or “seeds”. In particular, as a form of parameter learning, we are interested in the effect of allowing the given set of labels (and consequently, the response/statistics of the weighting function) to vary for obtaining lower energy segmentation solutions. This perturbation leads to a “refined” label set (or parameters) better suited to the input image, yielding segmentations that are less sensitive to the set of labels or seeds provided. Our proposed algorithm (using Parametric Pseudoflow) yields improvements over graph-cuts based segmentation with a fixed set of labels. We present experiments on about 450 3-D brain image volumes demonstrating the efficacy of the algorithm.
  • Keywords
    Markov processes; brain; graph theory; image segmentation; medical image processing; neurophysiology; 3-D brain image volumes; MRF; computer vision; graph-cuts based algorithms; label set perturbation; lower energy segmentation solutions; neuroimaging segmentation; weighting function; Biomedical imaging; Brain; Computer vision; Costs; Focusing; Image segmentation; Labeling; Neuroimaging; Parametric statistics; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-4420-5
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2009.5459305
  • Filename
    5459305