• DocumentCode
    2290551
  • Title

    Simulation of a closed loop multi-echelon repairable inventory system

  • Author

    Nie, Tao ; Sheng, Wen

  • Author_Institution
    Dept. of Grad. Manage., AFRA, Wuhan, China
  • fYear
    2009
  • fDate
    14-16 Sept. 2009
  • Firstpage
    663
  • Lastpage
    668
  • Abstract
    Repairable inventory is an important research field of improving operational readiness and reducing LCC (life cycle cost) for equipments. In spite of the sophisticated models and techniques were developed to manage the spares parts inventory in a multi-echelon system successfully, some restrictions still exist on its application to real case problems. To surpass some of these limitations a simulation model is developed in this paper. This thesis uses a discrete-event stochastic simulation model with Arena to establish a closed loop multi-echelon repairable inventory model, which can show the flow of demand information entities and parts entities moving between base and depot. Several examples are given to verify the model, discuss the effect of depot repair capacity on EBO (expect backorder) and optimize spares location. The results show that the proposed model is more accurate and efficient than METRIC (multi-echelon technique for recoverable item control) model.
  • Keywords
    discrete event simulation; inventory management; life cycle costing; maintenance engineering; stochastic processes; Arena; closed loop multiechelon repairable inventory system; discrete-event stochastic simulation; expect backorder; life cycle cost; supply availability; Availability; Conference management; Constraint optimization; Cost function; Engineering management; Force control; Inventory management; Optimization methods; Stochastic processes; Surveillance; EBO; METRIC; closed loop; multi-echelon; repairable inventory; supply availability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management Science and Engineering, 2009. ICMSE 2009. International Conference on
  • Conference_Location
    Moscow
  • Print_ISBN
    978-1-4244-3970-6
  • Electronic_ISBN
    978-1-4244-3971-3
  • Type

    conf

  • DOI
    10.1109/ICMSE.2009.5318240
  • Filename
    5318240