• DocumentCode
    2290569
  • Title

    Texel-based texture segmentation

  • Author

    Todorovic, Sinisa ; Ahuja, Narendra

  • Author_Institution
    Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    841
  • Lastpage
    848
  • Abstract
    Given an arbitrary image, our goal is to segment all distinct texture subimages. This is done by discovering distinct, cohesive groups of spatially repeating patterns, called texels, in the image, where each group defines the corresponding texture. Texels occupy image regions, whose photometric, geometric, structural, and spatial-layout properties are samples from an unknown pdf. If the image contains texture, by definition, the image will also contain a large number of statistically similar texels. This, in turn, will give rise to modes in the pdf of region properties. Texture segmentation can thus be formulated as identifying modes of this pdf. To this end, first, we use a low-level, multiscale segmentation to extract image regions at all scales present. Then, we use the meanshift with a new, variable-bandwidth, hierarchical kernel to identify modes of the pdf defined over the extracted hierarchy of image regions. The hierarchical kernel is aimed at capturing texel substructure. Experiments demonstrate that accounting for the structural properties of texels is critical for texture segmentation, leading to competitive performance vs. the state of the art.
  • Keywords
    document image processing; feature extraction; image segmentation; image texture; arbitrary image; geometric properties; image region extraction; multiscale segmentation; pdf; photometric properties; repeating patterns; spatial-layout properties; structural properties; texel-based texture segmentation; Bandwidth; Image segmentation; Kernel; Layout; Lighting; Optical materials; Optical variables control; Photometry; Shape; Surface texture;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-4420-5
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2009.5459308
  • Filename
    5459308