DocumentCode
2290671
Title
Advanced models for backscattering from rough surfaces
Author
Fung, Adrian K. ; Tjuatja, Saibun
Author_Institution
Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
fYear
2003
fDate
30 Sept.-4 Oct. 2003
Firstpage
659
Lastpage
663
Abstract
In surface scattering model applications a large variety of roughness conditions are encountered: some surfaces may be described with one roughness scale and others with more than one roughness scales; some surfaces are correlated exponentially, Gaussian-like or anywhere between the two. In this study we want to show two backscattering models in algebraic form: (1) a scattering model whose correlation function behaves like a Gaussian or an exponential function, and (2) a scattering model whose correlation function behaves like a Gaussian near the origin and nearly an exponential function at large lag distances. It is believed that most surface backscattering problems can be explained with one of the two models. Applications of these models to data interpretation are demonstrated.
Keywords
Gaussian processes; backscatter; correlation theory; electromagnetic wave scattering; integral equations; radiowave propagation; rough surfaces; Gaussian-like correlation; backscattering model; data interpretation; exponential correlation; roughness condition; surface scattering model; Backscatter; Frequency estimation; Fresnel reflection; Gaussian processes; Integral equations; Rough surfaces; Scattering; Surface roughness; Surface waves; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Integration of Knowledge Intensive Multi-Agent Systems, 2003. International Conference on
Print_ISBN
0-7803-7958-6
Type
conf
DOI
10.1109/KIMAS.2003.1245117
Filename
1245117
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