• DocumentCode
    2290671
  • Title

    Advanced models for backscattering from rough surfaces

  • Author

    Fung, Adrian K. ; Tjuatja, Saibun

  • Author_Institution
    Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
  • fYear
    2003
  • fDate
    30 Sept.-4 Oct. 2003
  • Firstpage
    659
  • Lastpage
    663
  • Abstract
    In surface scattering model applications a large variety of roughness conditions are encountered: some surfaces may be described with one roughness scale and others with more than one roughness scales; some surfaces are correlated exponentially, Gaussian-like or anywhere between the two. In this study we want to show two backscattering models in algebraic form: (1) a scattering model whose correlation function behaves like a Gaussian or an exponential function, and (2) a scattering model whose correlation function behaves like a Gaussian near the origin and nearly an exponential function at large lag distances. It is believed that most surface backscattering problems can be explained with one of the two models. Applications of these models to data interpretation are demonstrated.
  • Keywords
    Gaussian processes; backscatter; correlation theory; electromagnetic wave scattering; integral equations; radiowave propagation; rough surfaces; Gaussian-like correlation; backscattering model; data interpretation; exponential correlation; roughness condition; surface scattering model; Backscatter; Frequency estimation; Fresnel reflection; Gaussian processes; Integral equations; Rough surfaces; Scattering; Surface roughness; Surface waves; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integration of Knowledge Intensive Multi-Agent Systems, 2003. International Conference on
  • Print_ISBN
    0-7803-7958-6
  • Type

    conf

  • DOI
    10.1109/KIMAS.2003.1245117
  • Filename
    1245117