DocumentCode :
2290716
Title :
Wide-baseline image matching using Line Signatures
Author :
Wang, Lu ; Neumann, Ulrich ; You, Suya
Author_Institution :
Comput. Sci. Dept., Univ. of Southern California, Los Angeles, CA, USA
fYear :
2009
fDate :
Sept. 29 2009-Oct. 2 2009
Firstpage :
1311
Lastpage :
1318
Abstract :
We present a wide-baseline image matching approach based on line segments. Line segments are clustered into local groups according to spatial proximity. Each group is treated as a feature called a Line Signature. Similar to local features, line signatures are robust to occlusion, image clutter, and viewpoint changes. The descriptor and similarity measure of line signatures are presented. Under our framework, the feature matching is not only robust against affine distortion but also a considerable range of 3D viewpoint changes for non-planar surfaces. When compared to matching approaches based on existing local features, our method shows improved results with low-texture scenes. Moreover, extensive experiments validate that our method has advantages in matching structured non-planar scenes under large viewpoint changes and illumination variations.
Keywords :
image matching; feature matching; illumination variations; line segments; line signatures; wide-baseline image matching; Computer science; Distortion measurement; Geometry; Image matching; Image segmentation; Layout; Lighting; Object detection; Object recognition; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision, 2009 IEEE 12th International Conference on
Conference_Location :
Kyoto
ISSN :
1550-5499
Print_ISBN :
978-1-4244-4420-5
Electronic_ISBN :
1550-5499
Type :
conf
DOI :
10.1109/ICCV.2009.5459316
Filename :
5459316
Link To Document :
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