Title :
ARM 1176 implementation in SOI 45nm technology and silicon measurement
Author :
Pottier, Remy ; Tong, Jonathan ; Hawkins, Chris ; Kundu, Roma ; Pelloie, Jean-Luc
Author_Institution :
ARM, Grenoble, France
Abstract :
This paper demonstrates the strong power savings of IBM´s commercially available 45 nm high performance SOI technology on a standard ARM core compared with bulk CMOS low power technology. The benefits are shown for a typical design point for an ARM 11 implementation in mobile phone application. The implementation used standard SOI libraries from ARM and EDA tools.
Keywords :
integrated circuit design; integrated circuit measurement; integrated circuit testing; microprocessor chips; mobile radio; silicon-on-insulator; ARM 1176 implementation; EDA tools; IBM; SOI technology; SOI test chip design; bulk CMOS low power technology; mobile phone application; silicon measurement; size 45 nm; standard ARM core; standard SOI libraries; CMOS technology; Electronic design automation and methodology; Frequency; Logic design; Measurement standards; Power measurement; Semiconductor device measurement; Silicon; Testing; Voltage;
Conference_Titel :
SOI Conference, 2009 IEEE International
Conference_Location :
Foster City, CA
Print_ISBN :
978-1-4244-4256-0
Electronic_ISBN :
1078-621X
DOI :
10.1109/SOI.2009.5318733
