• DocumentCode
    2291599
  • Title

    LDMOS transistors on Si-on-SiC hybrid substrates having crystalline or poly-crystalline SiC - electrical and thermal characterization

  • Author

    Vallin, Ö ; Li, L.G. ; Norström, H. ; Smith, U. ; Olsson, J.

  • Author_Institution
    Angstrom Lab., Uppsala Univ., Uppsala, Sweden
  • fYear
    2009
  • fDate
    5-8 Oct. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    First ever demonstration of LDMOS transistors on Sion-SiC hybrid substrates. No degradation in transistor performance as compared to conventional SOI. PolySiC is available in larger wafer sizes but seems to have slightly lower heat conductivity than crystalline SiC. The intermediate alpha-Si layer provides electrical advantages and does not form any thermal barriers.
  • Keywords
    MOSFET; silicon-on-insulator; LDMOS transistors; SOI; SiC; crystalline electrical characterization; heat conductivity; intermediate layer; poly-crystalline electrical characterization; thermal barriers; thermal characterization; Conductivity; Crystallization; Insulation; Resistors; Silicon carbide; Silicon on insulator technology; Testing; Thermal resistance; Transconductance; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 2009 IEEE International
  • Conference_Location
    Foster City, CA
  • ISSN
    1078-621X
  • Print_ISBN
    978-1-4244-4256-0
  • Electronic_ISBN
    1078-621X
  • Type

    conf

  • DOI
    10.1109/SOI.2009.5318769
  • Filename
    5318769