DocumentCode
2291599
Title
LDMOS transistors on Si-on-SiC hybrid substrates having crystalline or poly-crystalline SiC - electrical and thermal characterization
Author
Vallin, Ö ; Li, L.G. ; Norström, H. ; Smith, U. ; Olsson, J.
Author_Institution
Angstrom Lab., Uppsala Univ., Uppsala, Sweden
fYear
2009
fDate
5-8 Oct. 2009
Firstpage
1
Lastpage
2
Abstract
First ever demonstration of LDMOS transistors on Sion-SiC hybrid substrates. No degradation in transistor performance as compared to conventional SOI. PolySiC is available in larger wafer sizes but seems to have slightly lower heat conductivity than crystalline SiC. The intermediate alpha-Si layer provides electrical advantages and does not form any thermal barriers.
Keywords
MOSFET; silicon-on-insulator; LDMOS transistors; SOI; SiC; crystalline electrical characterization; heat conductivity; intermediate layer; poly-crystalline electrical characterization; thermal barriers; thermal characterization; Conductivity; Crystallization; Insulation; Resistors; Silicon carbide; Silicon on insulator technology; Testing; Thermal resistance; Transconductance; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 2009 IEEE International
Conference_Location
Foster City, CA
ISSN
1078-621X
Print_ISBN
978-1-4244-4256-0
Electronic_ISBN
1078-621X
Type
conf
DOI
10.1109/SOI.2009.5318769
Filename
5318769
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