Title :
On properties of binary maxentropic DC-free runlength-limited sequences
Author_Institution :
Inst. for Exp. Math., Essen, Germany
Abstract :
We present the most remarkable results obtained from a numerical analysis of relevant statistical properties of binary maxentropic DC-free runlength-limited (DCRLL) sequences. In particular, we consider the sum variance and its relation to the low-frequency characteristic or the redundancy. Further, we present an approximation of the runlength distribution of binary maxentropic pure charge constrained sequences
Keywords :
binary sequences; entropy codes; numerical analysis; runlength codes; statistical analysis; binary maxentropic DC-free runlength-limited sequences; binary maxentropic pure charge constrained sequences; low-frequency characteristic; numerical analysis; redundancy; runlength distribution approximation; statistical properties; sum variance; Analysis of variance; Cutoff frequency; Density functional theory; Mathematics; Numerical analysis;
Conference_Titel :
Information Theory, 1995. Proceedings., 1995 IEEE International Symposium on
Conference_Location :
Whistler, BC
Print_ISBN :
0-7803-2453-6
DOI :
10.1109/ISIT.1995.531877
