Title :
From silicon direct wafer bonding to surface nano-patterning: a way to innovative substrate elaboration
Author :
Fournel, F. ; Bavard, A. ; Eymery, J.
Author_Institution :
CEA, MINATEC, Grenoble, France
Abstract :
Self-assembled configurations of nanostructures are expected to play an increasingly important role in devices design, as an alternative to conventional microelectronics technology. Conventional techniques are generally limited by the lack of simultaneous control on positioning, density and size uniformity of the nanostructures. To overcome these problems a new substrate based on controlled direct twist wafer bonding and preferential chemical etching has been developed.
Keywords :
elemental semiconductors; etching; germanium; gold; island structure; nanopatterning; nanostructured materials; nickel; self-assembly; semiconductor growth; semiconductor thin films; silicon; silicon compounds; surface structure; wafer bonding; Au; Ge; Ni; Si-SiO2; SiO2; direct twist wafer bonding; nanostructures; preferential chemical etching; self-assembled configurations; substrate; surface nanopatterning; Chemical technology; Etching; Microelectronics; Nanopatterning; Nanostructures; Semiconductor films; Silicon; Size control; Substrates; Wafer bonding;
Conference_Titel :
SOI Conference, 2009 IEEE International
Conference_Location :
Foster City, CA
Print_ISBN :
978-1-4244-4256-0
Electronic_ISBN :
1078-621X
DOI :
10.1109/SOI.2009.5318788