Title :
Frequency domain analysis and measurement on multi-path propagation for wideband microcellular environment
Author :
Nakazawa, Isao ; Takeuchi, Tsutomu
Author_Institution :
Div. of Mobile Commun., Fujitsu Ltd., Kawasaki, Japan
Abstract :
Amplitude notches in the transmission band have a large effect on high-speed digital mobile communication. This paper presents frequency domain analysis and measurements of multipath propagation for high-speed digital mobile radio communications in 400 MHz band. Multipath propagation characteristics of high-speed digital transmission are expressed in terms of in-band notch occurrence (IBNO), in-band notch 3dB-bandwidth probability (IBNW), and in-band group delay characteristics (IBGD). These characteristics are analyzed by Fourier transformation of delay profiles of five test routes in microcellular environments of 400 MHz around Kyoto University, Japan. IBNO and IBNW are compared with the infinite multipath wave model. Non-minimum phase shifts have been found to occur under condition of receiving delayed waves with higher level than proceeding waves. Non-minimum phase shift occurrence per notch (NMPS) is also calculated by treating IBGD. Delay spread and notch occurrence correlation are analyzed for the five test routes
Keywords :
Fourier transforms; UHF radio propagation; cellular radio; delays; digital radio; frequency-domain analysis; land mobile radio; multipath channels; Fourier transformation; Japan; Kyoto University; amplitude notches; delay profiles; delay spread; frequency domain analysis; frequency domain measurement; high-speed digital mobile communication; in-band group delay characteristics; in-band notch 3dB-bandwidth probability; in-band notch occurrence; infinite multipath wave model; multipath propagation; non-minimum phase shifts; notch occurrence correlation; test routes; transmission band; wideband microcellular environment; Antenna measurements; Cities and towns; Delay effects; Frequency domain analysis; Frequency measurement; Land mobile radio; Propagation delay; Testing; Time measurement; Wideband;
Conference_Titel :
Vehicular Technology Conference, 1994 IEEE 44th
Conference_Location :
Stockholm
Print_ISBN :
0-7803-1927-3
DOI :
10.1109/VETEC.1994.345147