• DocumentCode
    2291972
  • Title

    Improving accuracy of geometric parameter estimation using projected score method

  • Author

    Okatani, Takayuki ; Deguchi, Koichiro

  • Author_Institution
    Tohoku Univ., Sendai, Japan
  • fYear
    2009
  • fDate
    Sept. 29 2009-Oct. 2 2009
  • Firstpage
    1733
  • Lastpage
    1740
  • Abstract
    A fundamental problem in computer vision (CV) is the estimation of geometric parameters from multiple observations obtained from images; examples of such problems range from ellipse fitting to multi-view structure from motion (SFM). The maximum likelihood (ML) method is widely used to estimate the parameters in such problems, assuming Gaussian noises to be present in the observations, for example, bundle adjustment for SFM. According to the theory of statistics, the ML estimates are nearly optimal for these problems, provided that the variance of the observation noises is sufficiently small. This implies that when noises are not small, more accurate estimates can be derived as compared to the ML estimates. In this study, we propose the application of a method called the projected score method, developed in statistics for computing higher-accuracy estimates, to the CV problems. We describe how it can be customized to solve the CV problems and propose a numerical algorithm to implement the method. We show that the method works effectively for such problems.
  • Keywords
    Gaussian noise; computer vision; maximum likelihood estimation; parameter estimation; CV problems; Gaussian noises; computer vision; ellipse fitting; geometric parameter estimation; maximum likelihood method; multiple image observations; observation noises; projected score method; statistics theory; structure from motion; Computer vision; Estimation theory; Gaussian noise; H infinity control; Layout; Maximum likelihood estimation; Motion estimation; Parameter estimation; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2009 IEEE 12th International Conference on
  • Conference_Location
    Kyoto
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4244-4420-5
  • Electronic_ISBN
    1550-5499
  • Type

    conf

  • DOI
    10.1109/ICCV.2009.5459388
  • Filename
    5459388