Title :
Quickest Detection Of Transients
Author :
Broder, Bruce ; Schwartz, Stuart
Author_Institution :
Princeton University
Keywords :
Delay effects; Detectors; Integrated circuit modeling; Maximum likelihood detection; Maximum likelihood estimation; Performance analysis; Signal detection; Switches; Testing; Tin;
Conference_Titel :
Information Theory, 1991 (papers in summary form only received), Proceedings. 1991 IEEE International Symposium on (Cat. No.91CH3003-1)
Print_ISBN :
0-7803-0056-4
DOI :
10.1109/ISIT.1991.695412
