• DocumentCode
    2292703
  • Title

    Applications of neural networks for the power quality factors measurement - i.e. voltage fluctuations

  • Author

    Szlosek, Marcin ; Hanzelka, Zbigniew

  • Author_Institution
    ABB Corp. Res. Centre, Krakow, Poland
  • fYear
    2009
  • fDate
    15-17 Sept. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    It can be shown, that many flickermeters do not yield credible output readings although the manufacturers declare their compliance with the requirements of standard IEC 61000-4-15. Modifications or revisions to the standard and increasing the number of requirements, what is currently taking place, seem to be interim actions, whose results are dubious. On the other hand, it should be acknowledged that since over ten years the standardization of voltage fluctuations is based on the UIE flickermeter. The author idea is to treat a flickermeter - from its analogue input to the output of block 4 - as a black box, filled in by a designer accordingly to its decision, while maintaining the IN/OUT characteristics in conformity with those of the flickermeter regarded as a standard one. These instructions give you basic guidelines for preparing camera-ready papers for conference proceedings.
  • Keywords
    IEC standards; neural nets; power engineering computing; power measurement; power supply quality; IN-OUT characteristics; UIE flickermeter; neural networks; power quality factors measurement; standard IEC 61000-4-15; voltage fluctuations; Conference proceedings; Guidelines; IEC standards; Manufacturing; Neural networks; Power measurement; Power quality; Standardization; Voltage fluctuations; Voltage measurement; flickermeter; light flicker; neural networks; power quality; voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Power Quality and Utilisation, 2009. EPQU 2009. 10th International Conference on
  • Conference_Location
    Lodz
  • ISSN
    2150-6655
  • Print_ISBN
    978-1-4244-5171-5
  • Electronic_ISBN
    2150-6655
  • Type

    conf

  • DOI
    10.1109/EPQU.2009.5318836
  • Filename
    5318836