DocumentCode :
2293790
Title :
Improving model-based verification of embedded systems by analyzing component dependences
Author :
Siegl, Sebastian ; Caliebe, Philipp
Author_Institution :
Ingolstadt Instituts, Univ. Erlangen-Nuremberg, Ingolstadt, Germany
fYear :
2011
fDate :
15-17 June 2011
Firstpage :
51
Lastpage :
54
Abstract :
Embedded systems in automobiles become increasingly complex as they are intended to make vehicles even more safe, comfortable, and efficient. International norms like ISO 26262 and IEC 61165 postulate methods for the development and verification of safety critical systems. These standards should ensure that the dependability and quality of the embedded systems is maintained while their complexity and interdependence increases. Yet, the standards do not contain concrete methods or tools for their fulfillment. As concerns classic techniques for dependability analysis they either base on system analysis by means of Markov analysis or on reliability estimation from a usage perspective. Treating the system only from one perspective, however, is a drawback as the system analysis neglects functional or non-functional dependences of the system. These dependences can directly influence the reliability in the field usage. In this paper we present our approach to combine component dependency models with usage models to overcome these deficiencies. It is possible to identify usage scenarios which aim for critical dependences and to analyze the interaction of components inside the system. On the other hand usage scenarios can be assessed whether they meet the desired verification purpose. The component dependency models reveal dependences that were not identified before, because it allows the extraction of implications across functional and non functional dependences like memory, timing and processor utilization.
Keywords :
IEC standards; ISO standards; Markov processes; automotive engineering; embedded systems; formal verification; road safety; safety-critical software; IEC 61165 norm; ISO 26262 norm; Markov analysis; component dependency model; dependability analysis; embedded systems; memory utilization; model-based verification; processor utilization; reliability estimation; safety-critical systems; timing utilization; vehicle comfortability; vehicle efficiency; vehicle safety; Reliability; Safety; Software; Testing; Timing; Unified modeling language; Automated Testing; Dependability; Fault Tolerance; Road Vehicles; Safety Critical Systems; Software Testing; System Design; Validation; Verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Embedded Systems (SIES), 2011 6th IEEE International Symposium on
Conference_Location :
Vasteras
Print_ISBN :
978-1-61284-818-1
Electronic_ISBN :
978-1-61284-819-8
Type :
conf
DOI :
10.1109/SIES.2011.5953678
Filename :
5953678
Link To Document :
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