DocumentCode :
2294042
Title :
Control-flow error detection using combining basic and program-level checking in commodity multi-core architectures
Author :
Khoshavi, Navid ; Zarandi, Hamid R. ; Maghsoudloo, Mohammad
Author_Institution :
Dept. of Comput. Eng. & Inf. Technol., Amirkabir Univ. of Technol. (Tehran Polytech.), Tehran, Iran
fYear :
2011
fDate :
15-17 June 2011
Firstpage :
103
Lastpage :
106
Abstract :
This paper presents a software-based technique to detect control-flow errors using basic level control-flow checking and inherent redundancy in commodity multi-core processors. The proposed detection technique is composed of two phases of basic and program-level control-flow checking. Basic-level control-flow error detection is achieved through inserting additional instructions into program at design time regarding to control-flow graph. Previous research shows that modern superscalar microprocessors already contain significant amounts of redundancy. Program-level control-flow checking can detect CFEs by leveraging existing microprocessors redundancy. Therefore, the cost of adding extra redundancy for fault tolerance is eliminated. In order to evaluate the proposed technique, three workloads quick sort, matrix multiplication and linked list utilized to run on a multi-core processor, and a total of 6000 transient faults have been injected on the processor. The advantage of the proposed technique in terms of performance and memory overheads and detection capability compared with conventional control-flow error detection techniques.
Keywords :
multiprocessing systems; system monitoring; basic level control-flow checking; basic-level control-flow error detection; commodity multicore architectures; control-flow graph; linked list; matrix multiplication; program-level checking; quick sort; software-based technique; Fault tolerant systems; Hardware; Multicore processing; Redundancy; Software; Transient analysis; control-flow checking; control-flow error detection; inherent redundancy; multi-core processor; on-line testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Embedded Systems (SIES), 2011 6th IEEE International Symposium on
Conference_Location :
Vasteras
Print_ISBN :
978-1-61284-818-1
Electronic_ISBN :
978-1-61284-819-8
Type :
conf
DOI :
10.1109/SIES.2011.5953691
Filename :
5953691
Link To Document :
بازگشت