Title :
Quantized bi-histogram equalization
Author_Institution :
R&D Center, Samsung Electronics Co., Suwon, South Korea
Abstract :
Histogram equalization is a widely used scheme for contrast enhancement in a variety of applications due to its simple function and effectiveness. One possible drawback of the histogram equalization is that it can change the mean brightness of an image significantly as a consequence of histogram flattening. Clearly, this is not a desirable property when preserving the original mean brightness of a given image is necessary. As an effort to overcome such drawback for extending the applications of the histogram equalization in consumer electronic products, bi-histogram equalization has been proposed by the author which is capable of preserving the mean brightness of an image while it performs contrast enhancement. The essence of the bi-histogram equalization is to utilize independent histogram equalizations separately over two subimages obtained by decomposing the input image based on its mean. A simplified version of the bi-histogram equalization is proposed, which is referred to as the quantized bi-histogram equalization. The proposed algorithm provides a much simpler hardware (H/W) structure than the bi-histogram equalization since it is based on the cumulative density function of a quantized image. Thus, the realization of bi-histogram equalization in H/W is feasible, which leads to versatile applications in the field of consumer electronics
Keywords :
brightness; consumer electronics; equalisers; functions; image enhancement; quantisation (signal); algorithm; consumer electronic products; contrast enhancement; cumulative density function; histogram flattening; mean brightness; quantized bihistogram equalization; subimages; Back; Biomedical imaging; Brightness; Consumer electronics; Density functional theory; Electronic mail; Histograms; Radar applications; Radar imaging; Research and development;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 1997. ICASSP-97., 1997 IEEE International Conference on
Conference_Location :
Munich
Print_ISBN :
0-8186-7919-0
DOI :
10.1109/ICASSP.1997.595370