• DocumentCode
    22942
  • Title

    Hardware Variability-Aware Duty Cycling for Embedded Sensors

  • Author

    Wanner, Leo ; Apte, C. ; Balani, Rahul ; Gupta, Puneet ; Srivastava, M.

  • Author_Institution
    Dept. of Comput. Sci., Univ. of California, Los Angeles, Los Angeles, CA, USA
  • Volume
    21
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    1000
  • Lastpage
    1012
  • Abstract
    Instance and temperature-dependent power variation has a direct impact on quality of sensing for battery-powered long-running sensing applications. We measure and characterize the active and leakage power for an ARM Cortex M3 processor and show that, across a temperature range of 20 -60, there is a 10% variation in active power, and a variation in leakage power. We introduce variability-aware duty cycling methods and a duty cycle (DC) abstraction for TinyOS which allows applications to explicitly specify the lifetime and minimum DC requirements for individual tasks, and dynamically adjusts the DC rates so that the overall quality of service is maximized in the presence of power variability. We show that variability-aware duty cycling yields a improvement in total active time over schedules based on worst case estimations of power, with an average improvement of across a wide variety of deployment scenarios based on the collected temperature traces. Conversely, datasheet power specifications fail to meet required lifetimes by 7%-15%, with an average 37 days short of the required lifetime of 1 year. Finally, we show that a target localization application using variability-aware DC yields a 50% improvement in quality of results over one based on worst case estimations of power consumption.
  • Keywords
    embedded systems; microprocessor chips; power aware computing; ARM Cortex M3 processor; TinyOS; battery-powered long-running sensing application; datasheet power specification; duty cycle abstraction; embedded sensor; hardware variability-aware duty cycling; power consumption; temperature 20 C to 60 C; temperature-dependent power variation; Capacitance; Power demand; Power measurement; Temperature dependence; Temperature measurement; Temperature sensors; Duty cycling; energy-aware embedded software; hardware variability;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2012.2203325
  • Filename
    6232468