DocumentCode :
2294233
Title :
High power window tests at SLAC
Author :
Vlieks, A.E. ; Fowkes, W.R. ; Jongewaard, Erik ; Menegat, A. ; Tantawi, S. ; Chin, Y.H. ; Mizuno, Hidenori ; Takata, Kenta ; Ives, R. Lawrence ; Neilson, Jeffrey
Author_Institution :
SLAC, Stanford, CA
Volume :
2
fYear :
2001
fDate :
2001
Firstpage :
942
Abstract :
The successful design of high power windows play an essential role in RF power source development in accelerator programs such as the Next Linear Collider (NLC). Different window design approaches have been developed at several institutions to develop a successful high power window design. Some of the design considerations include the utilization of low loss RF modes, multiple RF modes and different window materials. In the past year some of these designs have been tested at SLAC using a pair of 50+ MW X-band klystrons as power sources. This permitted testing to power levels exceeding 100 MW at pulse widths ranging from 0.15 to 1.5 microseconds. We will present results of these tests including their RF performance and their optical and X-ray emission characteristics as a function of pulse width and power levels
Keywords :
X-ray production; accelerator RF systems; beam handling equipment; electron accelerators; electron beams; electron optics; klystrons; particle beam stability; storage rings; 0.15 to 1.5 mus; 100 MW; NLC; Next Linear Collider; SLAC; X-band klystrons; X-ray emission; accelerator programs; high power window tests; low loss RF modes; multiple RF modes; optical emission; power levels; power sources; pulse width; radiofrequency power source; Ceramics; Dielectric materials; Klystrons; Linear accelerators; Optical pulses; Optical surface waves; Radio frequency; Space vector pulse width modulation; Testing; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-7191-7
Type :
conf
DOI :
10.1109/PAC.2001.986533
Filename :
986533
Link To Document :
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