On-wafer differential noise figure measurement without couplers on a vector network analyzer

Author

Andee, Yogadissen ; Siligaris, Alexandre ; Graux, Francois ; Danneville, Frangois

Author_Institution

Univ. Grenoble Alpes, Grenoble, France

fYear

2014

fDate

4-5 Dec. 2014

Firstpage

1

Lastpage

4

Abstract

This papers presents a measurement technique for the noise figure of on-wafer differential amplifiers using 4-port network analyzers. The approach is based on the determination of the correlation of output noise waves in terms of the 4-port S-parameters and of the output noise powers. The measurement setup is simple as it does not require any hybrid coupler or calibrated noise source. Measurement results of an on-wafer differential LNA demonstrate the validity of the new technique.

Keywords

S-parameters; circuit noise; differential amplifiers; electric noise measurement; low noise amplifiers; network analysers; 4-port S-parameters; 4-port network analyzer; noise wave correlation determination; on-wafer differential LNA; on-wafer differential noise figure measurement; output noise power; vector network analyzer; Correlation; Couplers; Noise; Noise measurement; Probes; Receivers; Scattering parameters; Noise figure; differential amplifier; mixed-mode; network analyzer; on-wafer;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference (ARFTG), 2014 84th ARFTG

Conference_Location

Boulder, CO

Type

conf

DOI

10.1109/ARFTG.2014.7013403

Filename

7013403