DocumentCode :
229434
Title :
Evaluating the effect of using precision alignment dowels on connection repeatability of waveguide devices at frequencies from 750 GHz to 1.1 THz
Author :
Ridler, N.M. ; Clarke, R.G.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
fYear :
2014
fDate :
4-5 Dec. 2014
Firstpage :
1
Lastpage :
10
Abstract :
This paper describes an investigation into the effects of using additional precision alignment dowel pins on the connection repeatability performance of waveguide interfaces at submillimeter-wave frequencies. The waveguide interface type that was used for this investigation is an adapted version of the `precision´ UG-387 (i.e. based on the MIL-DTL-3922/67 design), manufactured by Virginia Diodes, Inc. The investigation was undertaken in the WM-250 waveguide band (i.e. at frequencies ranging from 750 GHz to 1.1 THz). Connection performance is compared with and without the use of added precision dowel pins in the inner dowel holes of this flange type. The repeatability of the measurements is assessed using statistical techniques, in terms of the experimental standard deviation in both the real and imaginary components of the complex-valued linear reflection coefficient.
Keywords :
military standards; submillimetre wave devices; waveguide couplers; waveguides; MIL-DTL-3922/67 design; WM-250 waveguide band; complex valued linear reflection coefficient; frequency 750 GHz to 1.1 THz; precision UG-387; precision alignment dowel pins; precision alignment dowels; submillimeter wave frequencies; waveguide device connection repeatability; waveguide interface; Apertures; Calibration; Flanges; IEEE standards; Pins; Reflection coefficient; Measurement repeatability; Submillimeter-wave measurements; VNA measurements; Waveguide flanges; Waveguide interfaces; Waveguide measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2014 84th ARFTG
Conference_Location :
Boulder, CO
Type :
conf
DOI :
10.1109/ARFTG.2014.7013405
Filename :
7013405
Link To Document :
بازگشت