DocumentCode :
229440
Title :
A test set-up for the analysis of multi-tone intermodulation in microwave devices
Author :
Teyssier, J.P. ; Sombrin, J. ; Quere, R. ; Laurent, S. ; Gizard, F.
Author_Institution :
XLIM, Univ. of Limoges, Limoges, France
fYear :
2014
fDate :
4-5 Dec. 2014
Firstpage :
1
Lastpage :
3
Abstract :
This paper proposes a multi-tone signal pattern designed for accurate and easy measurements of nonlinear devices linearity factors of merit. The stimulus signal we propose ensures that DUT´s third order intermodulation products won´t overlap. Thus, the relative phases of source tones do not affect the amplitudes of intermodulation products. The usual metrics for linearity factors, ACPR (Adjacent Channel Power Ratio) or NPR (Noise Power Ratio), can be acquired with a greater accuracy only with amplitude measurements. This work has been carried out with a sampler-based receiver, using FFT (Fast Fourier Transform) filtering for tone separation.
Keywords :
filtering theory; intermodulation; microwave devices; ACPR; DUT third order intermodulation products; FFT; NPR; adjacent channel power ratio; amplitude measurements; fast Fourier transform filtering; linearity factor of merit; microwave devices; multitone intermodulation analysis; multitone signal pattern; noise power ratio; nonlinear devices; sampler-based receiver; source tones; stimulus signal; test set-up; tone separation; Frequency measurement; Frequency modulation; Linearity; OFDM; Phase measurement; Radio frequency; Receivers; ACPR; Linearity factor; Multi-tone; NPR; Nonlinear devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2014 84th ARFTG
Conference_Location :
Boulder, CO
Type :
conf
DOI :
10.1109/ARFTG.2014.7013408
Filename :
7013408
Link To Document :
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