Title :
A calibration procedure for electronic calibration units
Author :
Stenarson, J. ; Eio, C. ; Yhland, K.
Author_Institution :
SP Tech. Res. Inst. of Sweden, Sweden
Abstract :
This paper presents a procedure for calibrating a Vector Network Analyzer (VNA) calibration kit, mechanical short, open, and load or electronic calibration unit, as a black box. The uncertainty is associated with each connector type in the calibration kit in the form of an uncertainty two-port. The method is validated by comparing results using different VNA test set configurations as well as a comparison to a traditional ripple technique.
Keywords :
calibration; measurement uncertainty; network analysers; VNA test set configurations; black box; connector type; electronic calibration unit; mechanical calibration kits; uncertainty two-port; vector network analyzer; Calibration; Connectors; Equations; Mathematical model; Sensitivity; Standards; Uncertainty; Calibration; Electronic Calibration Unit; Uncertainty; VNA;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2014 84th ARFTG
Conference_Location :
Boulder, CO
DOI :
10.1109/ARFTG.2014.7013414
