DocumentCode :
229457
Title :
Residual error analysis of a calibrated vector network analyzer
Author :
Mubarak, Faisal ; Rietveld, Gert
Author_Institution :
Van Swinden Lab. (VSL), Delft, Netherlands
fYear :
2014
fDate :
4-5 Dec. 2014
Firstpage :
1
Lastpage :
6
Abstract :
With S-parameter measurement uncertainties reaching accuracy limits far beyond those previously achieved, uncertainty evaluation methods need to be advanced as well. A method based on Fourier analysis is presented for uncertainty analysis of one-port Vector Network Analyzer (VNA) measurements. The new uncertainty assessment method is validated using a system-level VNA model designed in Advanced Design System (ADS) software. The model replicates a one-port airline measurement system and allows for simulation of typical measurement scenarios including different residual error levels. The simulated airline measurement data is used to validate the proposed uncertainty assessment algorithm and to find the right gating window in the Fourier analysis. One of the main analysis results for 3.5 mm precision connectors is that airlines of 15-cm length should be used in uncertainty analysis of calibrated one-port VNAs using the Fourier analysis method. For short airlines the frequency dependence of the residual errors and airline termination lead to much higher estimated VNA uncertainties.
Keywords :
Fourier analysis; S-parameters; calibration; computerised instrumentation; measurement errors; measurement uncertainty; microwave measurement; network analysers; ADS software; Fourier analysis; S-parameter measurement uncertainty evaluation method; advanced design system; airline termination; one-port airline measurement system; precision connectors; residual error analysis; size 15 cm; size 3.5 mm; system level VNA model; vector network analyzer calibration; Atmospheric modeling; Calibration; Frequency measurement; Measurement uncertainty; Signal processing algorithms; Time-domain analysis; Uncertainty; S-parameter; VNA; VNA calibration; VNA verification; airline; assessment technique; residual error; ripple technique;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2014 84th ARFTG
Conference_Location :
Boulder, CO
Type :
conf
DOI :
10.1109/ARFTG.2014.7013417
Filename :
7013417
Link To Document :
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