Title :
A trend detecting algorithm for ST-segment and rate abnormalities
Author :
Frisbie, William R.
Author_Institution :
Qmed Inc., Sag Harbor, NY, USA
Abstract :
A method is presented for processing beat-by-beat measurements of ST-segment deviation and rate to detect abnormal events of sufficient duration to trigger an alarm on a portable ECG monitor. The method removes the problem of rate dependency from the event-detection process. The algorithm maintains a sorted list of the 64 samples most recent of an 8-beat average of the measurement, taken once per second. A value from a particular list element is compared to a preprogrammed threshold to determine the presence of an alarm condition. The position of the list element used is determined by a programmed alarm window time and the prior presence of the alarm condition. This technique overcomes several difficulties: (1) cardiac-rate dependency is reduced by sampling an average value at a fixed clock rate; (2) event chopping due to fluctuations of a measurement above and below a threshold is eliminated by changing the sample point once an event is in progress; (3) sensitivity to outliers is reduced both by using 8-beat averages and by requiring multiple entries in the sorted list to cross the threshold before triggering or ending an event; (4) a programmable time window of acquisition for ST events is supported by making the sample slot offset variable
Keywords :
computerised signal processing; electrocardiography; medical computing; ST-segment deviation; alarm triggering; cardiac-rate dependency; event chopping; event-detection process; fixed clock rate; fluctuations; portable ECG monitor; preprogrammed threshold; programmed alarm window; rate abnormalities; sample slot offset; sorted list of; trend detecting algorithm; Current measurement; Displacement measurement; Electrocardiography; Event detection; Frequency; Hysteresis; Monitoring; Q measurement; Sampling methods; Time measurement;
Conference_Titel :
Computers in Cardiology, 1988. Proceedings.
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-1949-X
DOI :
10.1109/CIC.1988.72692