Title :
The Largest Amount of Fault Information in Analog Circuit Fault Diagnosis Based on Multisim Circuit Simulation
Author :
Yao Zhimin ; Jia Jizhou ; Ni Lei ; Tan Yanhong ; He Xin
Author_Institution :
Dept. of Missile Eng., Ordnance Eng. Coll., Shijiazhuang, China
Abstract :
Electronic equipment analog circuit has high failure rate, factors cause failure are fuzzy, fault diagnosis is complex. This method use Multisim circuit simulation software for band-pass filter circuit simulation and analysis, setting the soft and hard failures to obtain simulation results. Using the largest amount of fault information diagnosis method to seek the greatest amount of fault informative feature groups and determine the failure source. This method of fault diagnosis provides a reference for the measured data.
Keywords :
analogue circuits; band-pass filters; circuit simulation; fault diagnosis; software tools; Multisim circuit simulation software; analog circuit fault diagnosis; band-pass filter circuit simulation; electronic equipment analog circuit; fault information diagnosis method; Aging; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Educational institutions; Electrical fault detection; Electronic components; Fault diagnosis; Signal design; Circuit imulation; Fault Diagnosis; largest amount of faulte information;
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
Conference_Location :
Changsha City
Print_ISBN :
978-1-4244-5001-5
Electronic_ISBN :
978-1-4244-5739-7
DOI :
10.1109/ICMTMA.2010.351