• DocumentCode
    2295117
  • Title

    The Largest Amount of Fault Information in Analog Circuit Fault Diagnosis Based on Multisim Circuit Simulation

  • Author

    Yao Zhimin ; Jia Jizhou ; Ni Lei ; Tan Yanhong ; He Xin

  • Author_Institution
    Dept. of Missile Eng., Ordnance Eng. Coll., Shijiazhuang, China
  • Volume
    3
  • fYear
    2010
  • fDate
    13-14 March 2010
  • Firstpage
    893
  • Lastpage
    895
  • Abstract
    Electronic equipment analog circuit has high failure rate, factors cause failure are fuzzy, fault diagnosis is complex. This method use Multisim circuit simulation software for band-pass filter circuit simulation and analysis, setting the soft and hard failures to obtain simulation results. Using the largest amount of fault information diagnosis method to seek the greatest amount of fault informative feature groups and determine the failure source. This method of fault diagnosis provides a reference for the measured data.
  • Keywords
    analogue circuits; band-pass filters; circuit simulation; fault diagnosis; software tools; Multisim circuit simulation software; analog circuit fault diagnosis; band-pass filter circuit simulation; electronic equipment analog circuit; fault information diagnosis method; Aging; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Educational institutions; Electrical fault detection; Electronic components; Fault diagnosis; Signal design; Circuit imulation; Fault Diagnosis; largest amount of faulte information;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
  • Conference_Location
    Changsha City
  • Print_ISBN
    978-1-4244-5001-5
  • Electronic_ISBN
    978-1-4244-5739-7
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2010.351
  • Filename
    5459564