DocumentCode
2295117
Title
The Largest Amount of Fault Information in Analog Circuit Fault Diagnosis Based on Multisim Circuit Simulation
Author
Yao Zhimin ; Jia Jizhou ; Ni Lei ; Tan Yanhong ; He Xin
Author_Institution
Dept. of Missile Eng., Ordnance Eng. Coll., Shijiazhuang, China
Volume
3
fYear
2010
fDate
13-14 March 2010
Firstpage
893
Lastpage
895
Abstract
Electronic equipment analog circuit has high failure rate, factors cause failure are fuzzy, fault diagnosis is complex. This method use Multisim circuit simulation software for band-pass filter circuit simulation and analysis, setting the soft and hard failures to obtain simulation results. Using the largest amount of fault information diagnosis method to seek the greatest amount of fault informative feature groups and determine the failure source. This method of fault diagnosis provides a reference for the measured data.
Keywords
analogue circuits; band-pass filters; circuit simulation; fault diagnosis; software tools; Multisim circuit simulation software; analog circuit fault diagnosis; band-pass filter circuit simulation; electronic equipment analog circuit; fault information diagnosis method; Aging; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Educational institutions; Electrical fault detection; Electronic components; Fault diagnosis; Signal design; Circuit imulation; Fault Diagnosis; largest amount of faulte information;
fLanguage
English
Publisher
ieee
Conference_Titel
Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
Conference_Location
Changsha City
Print_ISBN
978-1-4244-5001-5
Electronic_ISBN
978-1-4244-5739-7
Type
conf
DOI
10.1109/ICMTMA.2010.351
Filename
5459564
Link To Document