DocumentCode :
2295621
Title :
Semi-analytical techniques for substrate characterization in the design of mixed-signal ICs
Author :
Charbon, E. ; Gharpurey, R. ; Meyer, R.G. ; Sangiovanni-Vincentelli, A.
Author_Institution :
Cadence Design Syst. Inc., San Jose, CA, USA
fYear :
1996
fDate :
10-14 Nov. 1996
Firstpage :
455
Lastpage :
462
Abstract :
A number of methods are presented for highly efficient calculation of substrate current transport. A three-dimensional Green´s Function based substrate representation, in combination with the use of the Fast Fourier Transform, significantly speeds up the computation of sensitivities with respect to all parameters associated with a given architecture. Substrate sensitivity analysis is used in a number of physical optimization tools, such as placement and trend analysis for the estimation of the impact of technology migration and/or layout re-design.
Keywords :
circuit CAD; circuit analysis computing; mixed analogue-digital integrated circuits; sensitivity analysis; Fast Fourier Transform; Green´s Function; layout re-design; mixed-signal ICs; placement; sensitivity analysis; substrate characterization; substrate current transport; technology migration; trend analysis; Assembly; Circuits; Computer architecture; Equations; Frequency; Instruments; Iterative algorithms; Marine vehicles; Noise reduction; RF signals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1996. ICCAD-96. Digest of Technical Papers., 1996 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-7597-7
Type :
conf
DOI :
10.1109/ICCAD.1996.569838
Filename :
569838
Link To Document :
بازگشت