DocumentCode
2295989
Title
The evaluation of full sensitivity for test generation in MVL circuits
Author
Dubrova, E.V. ; Gurov, D.B. ; Muzio, J.C.
Author_Institution
Dept. of Comput. Sci., Victoria Univ., BC, Canada
fYear
1995
fDate
23-25 May 1995
Firstpage
104
Lastpage
109
Abstract
The evaluation of a method for test generation for MVL circuits, based on the notion of full sensitivity, is given. The estimation is made on the functional level, by establishing a lower bound on the number of m-valued n-variable functions that are fully sensitive to all their variables. It is shown, that for practical values of m and n, the fraction of functions not fully sensitive to all their variables is extremely small. The consequences of this result in terms of test generation are discussed
Keywords
circuit analysis computing; fault diagnosis; logic testing; multivalued logic circuits; MVL circuits; full sensitivity evaluation; functional level; m-valued n-variable functions; multi-valued logic circuits; test generation; Boolean algebra; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Computer science; Integrated circuit testing; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Multiple-Valued Logic, 1995. Proceedings., 25th International Symposium on
Conference_Location
Bloomington, IN
ISSN
0195-623X
Print_ISBN
0-8186-7118-1
Type
conf
DOI
10.1109/ISMVL.1995.513517
Filename
513517
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