Title :
Waveguiding characteristics of SiO2 cover layer upon Kretschmann structure: Numerical analysis by the method of single expression
Author :
Baghdasaryan, H.V. ; Knyazyan, T.M. ; Hovhannisyan, T.T. ; Marciniak, M.
Author_Institution :
Fiber Opt. Commun. Lab., State Eng. Univ. of Armenia, Yerevan, Armenia
Abstract :
To analyse waveguiding characteristics of SiO2 cover layer upon Kretschman structure a relevant numerical modelling by the method of single expression is performed. Plasmonic and waveguiding properties of the structure are distinguished relying on optical field distributions for different thickness of the cover layer. Applications of thin SiO2 layer of the Kretschman structure as a protective cover and a low-loss waveguide are discussed.
Keywords :
numerical analysis; optical waveguides; plasmonics; silicon compounds; Kretschmann structure; SiO2; cover layer; low-loss waveguide; numerical analysis; numerical modelling; optical field distributions; plasmonic properties; single expression; waveguiding characteristics; waveguiding properties; Dielectrics; Optical reflection; Optical sensors; Optical surface waves; Optical waveguides; Plasmons; Reflectivity;
Conference_Titel :
Information Photonics (IP), 2011 ICO International Conference on
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-61284-315-5
DOI :
10.1109/ICO-IP.2011.5953816
