• DocumentCode
    2296226
  • Title

    Waveguiding characteristics of SiO2 cover layer upon Kretschmann structure: Numerical analysis by the method of single expression

  • Author

    Baghdasaryan, H.V. ; Knyazyan, T.M. ; Hovhannisyan, T.T. ; Marciniak, M.

  • Author_Institution
    Fiber Opt. Commun. Lab., State Eng. Univ. of Armenia, Yerevan, Armenia
  • fYear
    2011
  • fDate
    18-20 May 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    To analyse waveguiding characteristics of SiO2 cover layer upon Kretschman structure a relevant numerical modelling by the method of single expression is performed. Plasmonic and waveguiding properties of the structure are distinguished relying on optical field distributions for different thickness of the cover layer. Applications of thin SiO2 layer of the Kretschman structure as a protective cover and a low-loss waveguide are discussed.
  • Keywords
    numerical analysis; optical waveguides; plasmonics; silicon compounds; Kretschmann structure; SiO2; cover layer; low-loss waveguide; numerical analysis; numerical modelling; optical field distributions; plasmonic properties; single expression; waveguiding characteristics; waveguiding properties; Dielectrics; Optical reflection; Optical sensors; Optical surface waves; Optical waveguides; Plasmons; Reflectivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Photonics (IP), 2011 ICO International Conference on
  • Conference_Location
    Ottawa, ON
  • Print_ISBN
    978-1-61284-315-5
  • Type

    conf

  • DOI
    10.1109/ICO-IP.2011.5953816
  • Filename
    5953816
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2296226