Title :
DSP core verification using automatic test case generation
Author :
Glokler, Tilman ; Bitterlich, Stefan ; Meyr, Heinrich
Author_Institution :
Inst. for Integrated Signal Process. Syst., Tech. Hochschule Aachen, Germany
Abstract :
The verification methodology for a TMS320C25 compatible embedded DSP core is described. The DSP core has been implemented in synthesizable VHDL and has been cosimulated with the original DSP to verify correct behavior. Automatic test case generation together with hand-crafted code has been used as a means of providing stimuli to achieve increased RTL-simulation coverage. The cosimulation environment for this verification and the process of automatic test case generation is described in detail. Experimental results in terms of simulation coverage are discussed. Finally, a classification of all identified design flaws in the implementation is given and error-prone parts of the HDL design are identified
Keywords :
automatic test pattern generation; digital signal processing chips; formal verification; hardware description languages; integrated circuit design; DSP core verification; HDL design; RTL-simulation coverage; TMS320C25 compatible embedded DSP core; automatic test case generation; classification; cosimulation environment; design flaws; error-prone parts; hand-crafted code; synthesizable VHDL; Automatic testing; Cloning; Computer aided software engineering; Digital signal processing; Formal verification; Hardware design languages; Licenses; Resource management; Signal processing; Signal synthesis;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 2000. ICASSP '00. Proceedings. 2000 IEEE International Conference on
Conference_Location :
Istanbul
Print_ISBN :
0-7803-6293-4
DOI :
10.1109/ICASSP.2000.860098