Title :
Race-hazard and skip-hazard in multivalued combinational circuits
Author :
Wu, Xunwei ; Chen, Xiexiong ; Shen, Jihong
Author_Institution :
Dept. of Electron. Eng., Hangzhou Univ., China
Abstract :
The paper discusses race hazards based on AND/OR expression of functions in multivalued combinational circuits, and proposes techniques for eliminating race hazards by algebraic and K map´s means. Furthermore, the paper analyzes the skip hazard, another inherent hazard in multivalued circuits, and points out that it is a normal response for multivalued circuits. They can be restrained by using the input signals with fast transition or a small load capacitor
Keywords :
combinational circuits; hazards and race conditions; multivalued logic circuits; AND/OR expression; fast transition; input signals; multivalued circuits; multivalued combinational circuits; race hazards; race-hazard; skip hazard; skip-hazard; small load capacitor; Capacitors; Circuit analysis; Combinational circuits; Hazards; Logic circuits; Logic design; Multivalued logic; Pins; Signal analysis; Signal design;
Conference_Titel :
Multiple-Valued Logic, 1995. Proceedings., 25th International Symposium on
Conference_Location :
Bloomington, IN
Print_ISBN :
0-8186-7118-1
DOI :
10.1109/ISMVL.1995.513535
