DocumentCode
2296493
Title
Cost effective digital filter design for concurrent test
Author
Bayraktaroglu, Ismet ; Orailoglu, Alex
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Volume
6
fYear
2000
fDate
2000
Firstpage
3323
Abstract
Invariant-based concurrent test schemes can provide economical solutions to the problem of concurrent testing of digital filters. Design methodologies for digital filters ensuring concurrent testability are outlined. Experimental results confirm through fault simulation 100% fault coverage within area cost comparable to that of DfT for off-line test and with error detection latency well below human response times
Keywords
circuit testing; design for testability; digital filters; network synthesis; concurrent test; concurrent testability; cost effective digital filter design; design methodologies; fault coverage; fault simulation; invariant-based concurrent test schemes; Computer science; Concurrent computing; Costs; Delay; Design methodology; Digital filters; Fault detection; Fault diagnosis; Humans; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Acoustics, Speech, and Signal Processing, 2000. ICASSP '00. Proceedings. 2000 IEEE International Conference on
Conference_Location
Istanbul
ISSN
1520-6149
Print_ISBN
0-7803-6293-4
Type
conf
DOI
10.1109/ICASSP.2000.860111
Filename
860111
Link To Document