Title :
Proceedings International Conference on Computer Design. VLSI in Computers and Processors (Cat. No.98CB36273)
Abstract :
Presents the front cover of the conference proceedings.
Keywords :
VLSI; automatic test pattern generation; built-in self test; field programmable gate arrays; formal verification; high level synthesis; logic design; microprocessor chips; ARM microprocessor; ATPG; Alpha 21264 microprocessor; VLSI; asynchronous design techniques; built in self test; cache; design optimisation; formal verification; functional verification; high level synthesis; high performance design techniques; logic synthesis; memory systems; microarchitecture; mixed signal testing; performance analysis; prototype 1 GHz PowerPC microprocessor; routing; system performance issues;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-8186-9099-2
DOI :
10.1109/ICCD.1998.727015
