• DocumentCode
    2296697
  • Title

    Methods for calculating coupling noise in early design: a comparative analysis

  • Author

    Rahmat, Khalid ; Neves, José ; Lee, Jin-Fuw

  • Author_Institution
    Electron. Design Autom. Lab., IBM Corp., Hopewell Junction, NY, USA
  • fYear
    1998
  • fDate
    5-7 Oct 1998
  • Firstpage
    76
  • Lastpage
    81
  • Abstract
    In this paper we compare different methods for calculating coupling noise, specially for use in the early design phase of a high performance custom design when all the detailed physical design information is not available. This analysis can be important in the design of functional blocks such as data paths in microprocessors, where if noise avoidance is included in the design planning phase, later changes in the design may be avoided. Thus, reducing the number of design iterations and overall design time. The ideal noise calculation technique should be very fast and reasonably accurate so as to account for all significant parameters that will affect the noise. We consider three different techniques and compare them with an exact analysis using a circuit simulator. It is shown that a lumped model is quite accurate for predicting noise on a variety of wire geometries up to 3 mm in length. We also propose a technique to extend this model to the practically important case when bus wires overlap only partially with neighbors
  • Keywords
    VLSI; circuit CAD; circuit simulation; noise; bus wires; circuit simulator; coupling noise; data paths; detailed physical design information; functional blocks; high performance custom design; lumped model; microprocessors; noise calculation technique; Analytical models; Circuit analysis; Circuit noise; Circuit simulation; Microprocessors; Path planning; Phase noise; Predictive models; Solid modeling; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-8186-9099-2
  • Type

    conf

  • DOI
    10.1109/ICCD.1998.727026
  • Filename
    727026