Title :
Dynamic fault diagnosis for sequential circuits on reconfigurable hardware
Author :
Kocan, Fatih ; Saab, Daniel G.
Author_Institution :
Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
In this paper, we introduce a new approach for locating and diagnosing faults in sequential circuits. The approach is based on automatically designing a circuit which implements a closest match fault location algorithm specialized for the sequential circuit under diagnosis. Our result shows an order of magnitude improvements in term of speeds over software based fault location
Keywords :
fault diagnosis; fault location; logic testing; sequential circuits; closest match fault location algorithm; dynamic fault diagnosis; reconfigurable hardware; sequential circuits; software based fault location; Cause effect analysis; Circuit faults; Circuit testing; Computational modeling; Dictionaries; Fault diagnosis; Fault location; Hardware; Performance analysis; Sequential circuits;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-9099-2
DOI :
10.1109/ICCD.1998.727051
