• DocumentCode
    2297248
  • Title

    Hole transport in the p-type RTD

  • Author

    Soban, Z. ; Voves, J. ; Cukr, M. ; Novák, V.

  • Author_Institution
    Dept. of Microelectron., Czech Tech. Univ. in Prague, Prague
  • fYear
    2008
  • fDate
    12-16 Oct. 2008
  • Firstpage
    251
  • Lastpage
    254
  • Abstract
    Results of a RTD structure simulation by means of the nextnano3 [4] are shown. IV curve simulation by means wingreen program [3] and comparison with experimental results are presented in this paper. Our approach is based on the non-equilibrium green´s function (NEGF). We used the program Wingreen [3] only with the single band model apart for the heavy and light holes. We summarized the HH and LH transmissivity. The transmissivities and the local density of states are calculated by means of nextnano3 [4] using Contact Block Reduction methodfor the comparison. Our simulations can serve as the relatively fast estimate of the p-type RTD behavior. Our results are verified by the comparison with the experimental data measured on the MBE grown p-type RTD structures. Measured and simulated I-V characteristics for the p-RTD are shown in the Figure.
  • Keywords
    Green´s function methods; III-V semiconductors; aluminium compounds; gallium arsenide; resonant tunnelling diodes; AlAs-GaAs; I-V characteristics; density of states; hole transport; nonequilibrium Green function; p-type RTD; transmissivity; Effective mass; Gallium arsenide; Green´s function methods; Magnetoelectronics; Microelectronics; Molecular beam epitaxial growth; Physics; Resonant tunneling devices; Semiconductor devices; Variable speed drives;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices and Microsystems, 2008. ASDAM 2008. International Conference on
  • Conference_Location
    Smolenice
  • Print_ISBN
    978-1-4244-2325-5
  • Electronic_ISBN
    978-1-4244-2326-2
  • Type

    conf

  • DOI
    10.1109/ASDAM.2008.4743330
  • Filename
    4743330