• DocumentCode
    2297329
  • Title

    Low-loss 0.13-µm CMOS 50 – 70 GHz SPDT and SP4T switches

  • Author

    Atesal, Yusuf A. ; Cetinoneri, Berke ; Rebeiz, Gabriel M.

  • Author_Institution
    Univ. of California, La Jolla, CA, USA
  • fYear
    2009
  • fDate
    7-9 June 2009
  • Firstpage
    43
  • Lastpage
    46
  • Abstract
    This paper presents 50-70 GHz single-pole double-throw (SPDT) and single-pole four-throw (SP4T) switches built using a low-cost 0.13-Mm CMOS process. The switches are based on tuned lambda/4 designs with output matching networks. High substrate resistance together with deep trenches and isolation moats are used for low insertion loss. The SPDT and SP4T switches result in a measured insertion loss of 2.0 and 2.3 dB at 60 GHz, with an isolation of Gt 32 dB and Gt 22 dB, respectively. The measured output port-to-port isolation is Gt 27 dB for both designs. The P1dB is 13-14 dBm with a measured IIP3 of Gt 23 dBm for both switches. Both designs have a return loss better than -10 dB at all ports from 50 to 70 GHz. The active chip area is 0.39times0.32 mm2 (SPDT) and 0.59times0.45 mm2 (SP4T). To our knowledge, this paper presents the lowest loss 60 GHz SPDT and SP4T switches and also the highest isolation SPDT switch in any CMOS technology to-date.
  • Keywords
    CMOS integrated circuits; MMIC; microwave switches; semiconductor switches; SP4T switches; SPDT switches; deep trenches; frequency 50 GHz to 70 GHz; isolation moats; low-cost CMOS process; output matching networks; output port-to-port isolation; resistance; return loss; single-pole double-throw switches; single-pole four-throw switches; size 0.13 mum; CMOS technology; Capacitance; Communication switching; Impedance matching; Inductors; Insertion loss; Shunt (electrical); Substrates; Switches; Switching circuits; 0.13-µm CMOS; SP4T switch; SPDT switch; substrate resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium, 2009. RFIC 2009. IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-3377-3
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2009.5135486
  • Filename
    5135486