DocumentCode :
2297382
Title :
Memory Mapped SPM: Protecting Instruction Scratchpad Memory in Embedded Systems against Soft Errors
Author :
Farbeh, Hamed ; Fazeli, Mahdi ; Khosravi, Faramarz ; Miremadi, Seyed Ghassem
Author_Institution :
Dept. of Comput. Eng., Sharif Univ. of Technol., Tehran, Iran
fYear :
2012
fDate :
8-11 May 2012
Firstpage :
218
Lastpage :
226
Abstract :
Predictability, energy consumption, area and reliability are the major concerns in embedded systems. Using scratchpad memories (SPMs) instead of cache memories play an increasing role to satisfy these concerns. Both cache and SPM as on-chip SRAM memories are highly vulnerable to soft errors and as they contain the most frequently used blocks of the program, their errors can easily propagate in system leading to erroneous results. Unlike the instruction cache, an error in the instruction SPM cannot be corrected using only parity bits by invalidating the erroneous line. This study suggests a low-cost mechanism to protect the instruction SPM against soft errors. The main idea underlying the proposed mechanism includes four stages: 1) to use parity codes for error detection in the SPM, 2) to keep an address matching table in the main memory to store the address of the copy of SPM blocks in the main memory, in the case of dynamic SPM, 3) to allocate a specific segment of the main memory as an SPM backup, in the case of static SPM, and 4) to recover from errors using an interrupt service routine (ISR). Compared with a single error correction /double error detection (SEC-DED) scheme, by using a 2-bit interleaved-parity per word, the proposed mechanism can correct at least three bit errors, while SEC-DED is capable of correcting only single bit error and detecting 2-bit errors. The experimental results reveal that the energy consumption and area overheads of the proposed mechanism are approximately 22% and 15% less than that of SEC-DED for a 4Kbyte SPM, respectively. Moreover, this mechanism provides 10 times lower performance loss compared with SEC-DED.
Keywords :
SRAM chips; error correction codes; error detection; interleaved storage; parity check codes; storage allocation; SEC-DED scheme; SPM backup; SPM block copy; address matching table; address storage; area overhead; bit error; cache memory; double error detection; dynamic SPM; embedded systems; energy consumption; error recovery; instruction cache; instruction scratchpad memory protection; interleaved-parity per word; interrupt service routine; main memory segment allocation; memory mapped SPM; on-chip SRAM memories; parity bits; parity codes; predictability; program blocks; reliability; single error correction; soft errors; static SPM; Cache memory; Clocks; Embedded systems; Energy consumption; Memory management; Random access memory; Reliability; embedded processors; error correction; reliability; scratchpad memory; soft errors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Computing Conference (EDCC), 2012 Ninth European
Conference_Location :
Sibiu
Print_ISBN :
978-1-4673-0938-7
Type :
conf
DOI :
10.1109/EDCC.2012.13
Filename :
6214777
Link To Document :
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