• DocumentCode
    2297452
  • Title

    Influence of relativistic and quantum effects on the blur in projection lithography systems

  • Author

    Roshchupkin, S.P. ; Storizhko, V.E. ; Denisenko, O.I. ; Voroshilo, A.I. ; Starodub, S.S. ; Nedoreshta, V.N. ; Sulkio-Cleff, B.

  • Author_Institution
    Appl. Phys. Inst., Nat. Acad. of Sci. of Ukraine, Sumy, Ukraine
  • fYear
    2003
  • fDate
    19-20 Sept. 2003
  • Firstpage
    122
  • Lastpage
    124
  • Abstract
    Classical and quantum effects producing changes in the blur for electronand- ion (H+ and He+) projection lithography are theoretically considered. Typically, the systems studied in this report operate with beam current up to 200 μA and beam voltage up to 200 keV. The influence of a strong laser field on the interaction of beam particles into crossover is theoretically investigated. It is predicted, that for intensities of a laser field and for defined parameters of a beam, the effective potential of interaction of beam particles becomes a potential of attraction. It is shown, that this effect allows correcting the blur effect. The influence of quantum effects into crossover on blur is theoretically studied. It is shown, that for sufficiently strong currents and close-cut beams, the corrections due to quantum effects into crossover can have essential influence on blur.
  • Keywords
    electron beam lithography; electron beams; ion beam lithography; ion beams; laser beams; quantum optics; relativistic quantum mechanics; 200 keV; 200 muA; H+; He+; beam particles interaction; blur effect; crossover; electron projection lithography; ion projection lithography; laser field; quantum effects; relativistic effects; Current density; Integral equations; Lithography; Nuclear physics; Particle beams; Quantum mechanics; Space charge; Stochastic processes; Stochastic systems; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Laser and Fiber-Optical Networks Modeling, 2003. Proceedings of LFNM 2003. 5th International Workshop on
  • Print_ISBN
    0-7803-7709-5
  • Type

    conf

  • DOI
    10.1109/LFNM.2003.1246096
  • Filename
    1246096