DocumentCode :
2297811
Title :
On modeling parasitic control loops in RF SoCs: Cross-coupling and spurious analysis
Author :
Muhammad, K. ; Hung, Chih-Ming ; Choo, Hunsoo ; Cubukcu, Erkin
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
2009
fDate :
7-9 June 2009
Firstpage :
179
Lastpage :
182
Abstract :
Migrating solutions to the most advance CMOS process node addresses cost reduction but increases RF interference within a SoC. In this paper we address the issue of design verification of single-chip RF SOCs in the presence of unintentional cross-couplings and leakages due to proximity of aggressors and victims. We will extend a previously presented VHDL based simulation methodology that accepts RF input and analyzes receiver BER performance, transmitter output distortion and phase noise by processing several thousand packets of baseband information while compensation algorithms are simultaneously executed. This approach allows building complex RF SoC systems based on behavioral models and has been successfully applied to investigate system behavior in the presence of aggressing nodes that create parasitic control loops due to unintentional and undesirable coupling paths.
Keywords :
CMOS integrated circuits; error statistics; hardware description languages; interference (signal); phase noise; radio transmitters; system-on-chip; BER performance; CMOS process node; RF SoC; RF interference; VHDL based simulation methodology; cost reduction; parasitic control loops; phase noise; radio transmitter; spurious analysis; unintentional cross-couplings; Algorithm design and analysis; Analytical models; Bit error rate; CMOS process; Costs; Electromagnetic interference; Information analysis; Performance analysis; Radio frequency; Semiconductor device modeling; Bluetooth; GSM; RF; SoC; VHDL; behavioral; cellular; modeling; receiver; transceiver; transmitter; verification; wireless;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium, 2009. RFIC 2009. IEEE
Conference_Location :
Boston, MA
ISSN :
1529-2517
Print_ISBN :
978-1-4244-3377-3
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2009.5135517
Filename :
5135517
Link To Document :
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