DocumentCode :
2298184
Title :
Texas Instruments´ 4 Mb DRAM-a new, faster generation of DRAM
Author :
Rhodine, Craig W.
Author_Institution :
Texas Instrum. Inc., Midland, TX, USA
fYear :
1991
fDate :
20-24 May 1991
Firstpage :
317
Abstract :
A 4-Mb DRAM (dynamic random access memory) family which improves upon the performance of the 1 Mb DRAM family is described. While increasing storage density and reducing memory access times, overall chip size is minimally affected. Development of 0.9-μm CMOS technology for use on the 4-Mb DRAM allowed immediate speed and size improvements over the 1-Mb DRAM. Continual review of lessons learned on previous design insures that each successive DRAM generation is both more efficient in terms of architecture and more reliable in system use. In the case of the 4-Mb DRAM, this dedication to improvement has resulted tin a 20% speed enhancement, moderate size increase (1.6X), and improved reliability results
Keywords :
CMOS integrated circuits; DRAM chips; Texas Instruments computers; integrated circuit technology; memory architecture; 0.9 micron; 4 Mbit; CMOS technology; DRAM; IC technology; Texas Instruments; chip size; dynamic random access memory; military equipment; reliability; size; speed; storage density; Circuits; Delay effects; Instruments; Packaging; Random access memory; Sockets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-0085-8
Type :
conf
DOI :
10.1109/NAECON.1991.165766
Filename :
165766
Link To Document :
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