Current-based testing for analog and mixed-signal circuits

A new test technique for analog and mixed-signal circuits which employs current signals as input test stimuli is presented in this paper. With the current-based test technique proposed, it is possible to simplify test stimulus generation, minimize the probability of erroneous test decisions and maximize fault coverage. In addition, this technique has significant advantages for DFT and BIST implementations, since high controllability can be achieved for test stimulus application, and analog multiplexers are not required in the signal path of the analog system to apply the current-based test stimuli. The technique is illustrated by means of opamp circuits and analog filters, and by considering catastrophic and parametric faults