Title :
A New Approach to Online Testing of TGFSOP-based Ternary Toffoli Circuits
Author :
Nayeem, N.M. ; Rice, J.E.
Author_Institution :
Dept. of Math & Comput. Sci., Univ. of Lethbridge, Lethbridge, AB, Canada
Abstract :
Previous work presented a simple technique for converting an ESOP-based Boolean reversible circuit into an online testable circuit. This paper builds on the previous work by extending its application to circuits consisting of cascades of ternary Toffoli gates. The technique is applied to an existing cascade of ternary Toffoli gates, and requires that a single additional line be added to facilitate the propagation of any faults that are identified, as well as modification and/or addition of some gates. The modified circuit can detect online any single-bit errors that occur within the circuit. Experimental results compare very favourably to the only other known approach.
Keywords :
Galois fields; logic circuits; logic gates; logic testing; ternary logic; TGFSOP-based ternary Toffoli circuits; faults propagation; online testing; single-bit errors; ternary Galois field sum of products; ternary Toffoli gate cascading; Benchmark testing; Circuit faults; Galois fields; Integrated circuit modeling; Logic gates; Vectors; Ternary circuit; online testing; reversible logic;
Conference_Titel :
Multiple-Valued Logic (ISMVL), 2012 42nd IEEE International Symposium on
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4673-0908-0
DOI :
10.1109/ISMVL.2012.57
