Title :
High resolution DEMs for urban applications
Author :
Davis, Curt H. ; Wang, Xiangyun
Author_Institution :
Dept. of Electr. Eng., Missouri Univ., Columbia, MO, USA
Abstract :
The authors demonstrate that digitally-scanned 1:40,000-scale NAPP aerial photography, used in conjunction with precision ground control, can be used to generate DEMs with horizontal resolutions of 1-3 m. The vertical accuracies of the DEMs were evaluated using more than 50,000 check points derived from a precision kinematic GPS survey. The results indicate the DEMs have RMS vertical accuracies on the order of 1.8-2.5 m. The DEMs are shown to reveal very fine-scale features in an urban test area. The horizontal resolution and vertical accuracy of the NAPP DEMs are many times better than those currently derived from satellite remote sensing platforms. Moreover, the NAPP imagery are an inexpensive source of data that are readily available throughout most of the United States
Keywords :
geodesy; geophysical techniques; photogrammetry; topography (Earth); DEM; NAPP; USA; United States; aerial photography; city; digital elevation model; geodesy; geophysical measurement technique; high resolution DEM; land surface topography; photogrammetry; precision ground control; town; urban area; vertical accuracy; Cities and towns; Image resolution; Kinematics; Laser radar; Photography; Radar imaging; Satellites; Spaceborne radar; Spatial resolution; Synthetic aperture radar interferometry;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
DOI :
10.1109/IGARSS.2000.860279
