DocumentCode :
2299252
Title :
Use of directional variance for urban area analysis on simulated Spot 5 images
Author :
Bessettes, V. ; Desachy, J. ; Lefevre, M.J.
Author_Institution :
IRIT, Univ. Paul Sabatier, Toulouse, France
Volume :
7
fYear :
2000
fDate :
2000
Firstpage :
2890
Abstract :
CNES is due to launch the SPOT 5 satellite during 2001. One of its particularities, compared to the previous generations of SPOT satellites, will be its high resolution in panchromatic mode (5m and Supermode 2.5m). Before launch, CNES has to validate the choices made for the sensors with the use of simulated images. The authors´s study has been made as part of the use of SPOT 5 panchromatic images for urban area analysis. The aim of the study is to extract urban areas and roads from panchromatic simulated SPOT 5 images. The proposed method combines a textural feature extraction with segmentation by edge detection in order to improve the final classification. At first, they define a textural feature based on the directional variance of the image. Then they use classification algorithms on this feature, combined with an edge detection operator, to extract the urban areas and the roads from the image
Keywords :
feature extraction; geophysical signal processing; geophysical techniques; image classification; image texture; remote sensing; terrain mapping; SPOT 5; algorithm; city; directional variance; edge detection; feature extraction; geophysical measurement technique; high resolution; image classification; image processing; image texture; land surface; optical imaging; panchromatic image; panchromatic mode; road; satellite remote sensing; segmentation; terrain mapping; textural feature extraction; town; urban area; urban area analysis; Analysis of variance; Analytical models; Feature extraction; Image analysis; Image edge detection; Image segmentation; Image sensors; Roads; Satellites; Urban areas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
Type :
conf
DOI :
10.1109/IGARSS.2000.860280
Filename :
860280
Link To Document :
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