• DocumentCode
    229963
  • Title

    Comparative analysis of GaN FET power system for maximizing system benefit

  • Author

    Jung-Hoon Ahn ; Byoung-Kuk Lee ; Jong-Soo Kim

  • Author_Institution
    Coll. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
  • fYear
    2014
  • fDate
    22-25 Oct. 2014
  • Firstpage
    1915
  • Lastpage
    1920
  • Abstract
    This paper carries out a series of the analysis of the power system using gallium nitride (GaN) FET which has a wide band gap (WBG) characteristics comparing to the conventional silicon (Si) MOSFET-used power system. At first, for the comparison of each semiconductor device, the switching-transient parameter is quantitatively extracted from the released information of GaN FET. And GaN FET model which reflect this dynamic property is configured. By using this model, the performance of GaN FET is analyzed comparing to Si MOSFET. As a result, GaN FET power system, designed by the optimal point suggested in this paper, can reduce the loss by 25.5% and the volume by 78.6% of major components comparing conventional Si MOSFET power system.
  • Keywords
    III-V semiconductors; field effect transistors; gallium compounds; power systems; wide band gap semiconductors; FET power system; GaN; WBG characteristics; comparative analysis; optimal point; semiconductor device; switching-transient parameter; system benefit maximization; wide band gap characteristics; Barium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems (ICEMS), 2014 17th International Conference on
  • Conference_Location
    Hangzhou
  • Type

    conf

  • DOI
    10.1109/ICEMS.2014.7013809
  • Filename
    7013809