Title :
Comparative analysis of GaN FET power system for maximizing system benefit
Author :
Jung-Hoon Ahn ; Byoung-Kuk Lee ; Jong-Soo Kim
Author_Institution :
Coll. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon, South Korea
Abstract :
This paper carries out a series of the analysis of the power system using gallium nitride (GaN) FET which has a wide band gap (WBG) characteristics comparing to the conventional silicon (Si) MOSFET-used power system. At first, for the comparison of each semiconductor device, the switching-transient parameter is quantitatively extracted from the released information of GaN FET. And GaN FET model which reflect this dynamic property is configured. By using this model, the performance of GaN FET is analyzed comparing to Si MOSFET. As a result, GaN FET power system, designed by the optimal point suggested in this paper, can reduce the loss by 25.5% and the volume by 78.6% of major components comparing conventional Si MOSFET power system.
Keywords :
III-V semiconductors; field effect transistors; gallium compounds; power systems; wide band gap semiconductors; FET power system; GaN; WBG characteristics; comparative analysis; optimal point; semiconductor device; switching-transient parameter; system benefit maximization; wide band gap characteristics; Barium;
Conference_Titel :
Electrical Machines and Systems (ICEMS), 2014 17th International Conference on
Conference_Location :
Hangzhou
DOI :
10.1109/ICEMS.2014.7013809