• DocumentCode
    2299637
  • Title

    Scalable electromagnetic segmentation methodology for accurate investigation of inductive couplings

  • Author

    Kampe, Hugues ; Wane, Sidina ; Tesson, Olivier ; Murray, Hugues ; Descamps, Philippe ; Martin, Patrick

  • Author_Institution
    LaMIPS, ENSICAEN UCBN Microelectron. Lab., France
  • fYear
    2009
  • fDate
    7-9 June 2009
  • Firstpage
    607
  • Lastpage
    610
  • Abstract
    In this paper electromagnetic (EM) based segmentation methodology is proposed for design, analysis and simulation of inductive couplings in RFICs. The efficiency of the proposed methodology is demonstrated through its application to NXP-Semiconductors component and function-block test-carriers. The obtained simulation results are successfully correlated to measurement results and other relevant methods and techniques. Different segmentation strategies are compared to draw limits of cascade assumptions in comparison with full-EM model approaches and experimental results. Guidelines and design rules derivation towards standard segmentation-based scalable wideband model synthesis for electromagnetic Interference (EMI) aware design analysis, both at component and block levels are discussed.
  • Keywords
    electromagnetic coupling; electromagnetic interference; radiofrequency integrated circuits; NXP-Semiconductors component; RFIC; electromagnetic Interference aware design analysis; electromagnetic segmentation methodology; full-EM model approaches; function-block test-carriers; inductive couplings; wideband model synthesis; Analytical models; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic induction; Electromagnetic interference; Electromagnetic measurements; Guidelines; Radiofrequency integrated circuits; Testing; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium, 2009. RFIC 2009. IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-3377-3
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2009.5135615
  • Filename
    5135615