DocumentCode :
2299637
Title :
Scalable electromagnetic segmentation methodology for accurate investigation of inductive couplings
Author :
Kampe, Hugues ; Wane, Sidina ; Tesson, Olivier ; Murray, Hugues ; Descamps, Philippe ; Martin, Patrick
Author_Institution :
LaMIPS, ENSICAEN UCBN Microelectron. Lab., France
fYear :
2009
fDate :
7-9 June 2009
Firstpage :
607
Lastpage :
610
Abstract :
In this paper electromagnetic (EM) based segmentation methodology is proposed for design, analysis and simulation of inductive couplings in RFICs. The efficiency of the proposed methodology is demonstrated through its application to NXP-Semiconductors component and function-block test-carriers. The obtained simulation results are successfully correlated to measurement results and other relevant methods and techniques. Different segmentation strategies are compared to draw limits of cascade assumptions in comparison with full-EM model approaches and experimental results. Guidelines and design rules derivation towards standard segmentation-based scalable wideband model synthesis for electromagnetic Interference (EMI) aware design analysis, both at component and block levels are discussed.
Keywords :
electromagnetic coupling; electromagnetic interference; radiofrequency integrated circuits; NXP-Semiconductors component; RFIC; electromagnetic Interference aware design analysis; electromagnetic segmentation methodology; full-EM model approaches; function-block test-carriers; inductive couplings; wideband model synthesis; Analytical models; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic induction; Electromagnetic interference; Electromagnetic measurements; Guidelines; Radiofrequency integrated circuits; Testing; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium, 2009. RFIC 2009. IEEE
Conference_Location :
Boston, MA
ISSN :
1529-2517
Print_ISBN :
978-1-4244-3377-3
Electronic_ISBN :
1529-2517
Type :
conf
DOI :
10.1109/RFIC.2009.5135615
Filename :
5135615
Link To Document :
بازگشت