• DocumentCode
    2300311
  • Title

    Phase factors representation for EM scattering from a rough surface perfect conductor

  • Author

    Tatarskii, V.I.

  • Author_Institution
    Cooperative Inst. for Res. in Environ. Sci., Colorado Univ., Boulder, CO, USA
  • Volume
    7
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    3096
  • Abstract
    The surface magnetic field (current) integral equation for a plane in an average rough interface between a vacuum and a perfect conductor is considered. This equation is presented in a form that contains the random elevations only in a form of exponential functions with purely imagined exponents. Iterations of this equation lead to a solution in powers of multiplicity of the Kirchhoff scattering, and each iterative term contains the random elevations only in exponents. Because the modulus of such functions is equal to unity, one may expect that convergence of such series is independent of the Rayleigh parameter. All mean values can be expressed directly in terms of joint characteristic functions of elevations in different points of a rough surface. To develop this representation of the scattering problem the author uses the three-dimensional Green´s function in terms of the one-dimensional Fourier integral with respect to z
  • Keywords
    electromagnetic wave scattering; rough surfaces; 1D Fourier integral; 3D Green function; EM scattering; Kirchhoff scattering; Rayleigh parameter; average rough interface; integral equation; joint characteristic functions; phase factors representation; rough surface perfect conductor; surface current; surface magnetic field; vacuum-perfect conductor interface; Acoustic scattering; Conductors; Electromagnetic scattering; Integral equations; Magnetic fields; Rayleigh scattering; Rough surfaces; Surface acoustic waves; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    0-7803-6359-0
  • Type

    conf

  • DOI
    10.1109/IGARSS.2000.860348
  • Filename
    860348